ZSX Primus IV

Scanning X-ray fluorescence analyzer

This is a top-illumination type scanning X-ray fluorescence analyzer that can be used safely for routine analysis. It is equipped with “ZSX Guidance” that supports measurement and analysis, so even beginners can easily obtain accurate analysis results. The digital counting system, high-speed goniometer, and optimized control system achieve high-speed and high-precision measurement. Ultra-light element measurement is also possible with artificial multi-layer stacked films and vacuum control mechanisms. This high-spec model is designed for safety and security, with features such as human error prevention, and is also equipped with point mapping analysis and scattered radiation SQX functions.

ZSX Primus IV Overview

Top illumination method.

The top illumination method allows for safe use in routine analysis. Even if powder from a powder sample scatters, it does not affect the optical system. No film is required to protect the sample.

Automatic setting function for quantitative application

By simply entering the standard values ​​of the standard sample and sample information, the analytical line and optical system settings, coexisting element correction, and overlap correction are automatically set, making it easy for even beginners to store the calibration curve.

Optimal measurement line search and analysis evaluation program for film thickness and adhesion amount analysis

You can obtain the most accurate combination of analysis lines, analysis depth information for analysis lines, simulation results for the proportion of absorption by upper layers, and information on interference lines.

“Easy analysis” with excellent operability

“Easy Analysis” consolidates the operations required for daily routine analysis, allowing you to call up a series of analysis settings with one touch and register frequently used applications as “favorites.”

High-speed analysis

Throughput has been improved through high-speed sample transport, a high-speed drive goniometer, high-speed data processing, and efficient control of each drive unit. Qualitative analysis time can be shortened by approximately 40%, and quantitative analysis time by approximately 20% (compared to our previous model), allowing the number of samples processed per unit time to be increased.

High-precision measurements

The X-ray counting system uses a digital multi-channel analyzer (D-MCA). High-speed digital processing has achieved count linearity up to a high count rate range, improving analytical accuracy. Maximum count rate (count linearity 1%): SC 1800kcps, F-PC 3000kcps

Preventing human error

The access level to the software can be set for each operator. This prevents database changes or deletions caused by beginners’ mistakes. The program menu can be displayed or hidden for each user level, preventing human error.

Point mapping analysis in the WDX system

Equipped with a high-resolution camera, it can clearly display an enlarged image of a specified part of the entire sample image. This allows accurate positioning even in minute areas. In addition, the r-θ sample stage allows all measurement positions to be measured with the same sensitivity, enabling accurate analysis.